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18th IEEE VLSI Test Symposium (VTS'00)
P1450.1: STIL for the Simulation Environment
Montreal, Canada
April 30-May 04
ISBN: 0-7695-0613-5
ASCII Text
x 
 
Peter Wohl, Nathan Biggs, "P1450.1: STIL for the Simulation Environment," VLSI Test Symposium, IEEE, pp. 389, 18th IEEE VLSI Test Symposium (VTS'00), 2000.
 
 
BibTex
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@article{ 10.1109/VTEST.2000.843869,
author = {Peter Wohl and Nathan Biggs},
title = {P1450.1: STIL for the Simulation Environment},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2000},
issn = {1093-0167},
pages = {389},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2000.843869},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - P1450.1: STIL for the Simulation Environment
SN - 1093-0167
SP
EP
A1 - Peter Wohl,
A1 - Nathan Biggs,
PY - 2000
KW - test standards
KW - test pattern simulation
KW - test generation
KW - test pattern databases
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Peter Wohl, Synopsys Inc.
Nathan Biggs, Priority Technologies Inc.
The Standard Test Interface Language (STIL IEEE-1450) was developed to transport patterns from the generation environment to testers. STIL was also shown to support test-generation input constructs. This paper analyzes the requirements of the simulation environment and presents extensions to STIL (IEEE-P1450.1) to support all aspects of test-pattern generation and simulation.
Index Terms:
test standards, test pattern simulation, test generation, test pattern databases
Citation:
Peter Wohl, Nathan Biggs, "P1450.1: STIL for the Simulation Environment," vts, pp.389, 18th IEEE VLSI Test Symposium (VTS'00), 2000
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