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18th IEEE VLSI Test Symposium (VTS'00)
Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators
Montreal, Canada
April 30-May 04
ISBN: 0-7695-0613-5
ASCII Text
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Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski, "Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators," VLSI Test Symposium, IEEE, pp. 377, 18th IEEE VLSI Test Symposium (VTS'00), 2000.
 
 
BibTex
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@article{ 10.1109/VTEST.2000.843868,
author = {Grzegorz Mrugalski and Jerzy Tyszer and Janusz Rajski},
title = {Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2000},
issn = {1093-0167},
pages = {377},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2000.843868},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators
SN - 1093-0167
SP
EP
A1 - Grzegorz Mrugalski,
A1 - Jerzy Tyszer,
A1 - Janusz Rajski,
PY - 2000
KW - Built-In Self-Test
KW - Linear Dependencies
KW - Phase Shifters
KW - Test Pattern Generators
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Grzegorz Mrugalski, Poznan University of Technology
Jerzy Tyszer, Poznan University of Technology
Janusz Rajski, Mentor Graphics Corporation
Probability of obtaining desired test patterns in subsequences generated by two-dimensional test pattern generators is examined. Various architectures of generators comprised of linear feedback shift registers, cellular automata and associated phase shifters are thoroughly investigated. Two new algorithms that can be employed to synthesize phase shifters minimizing linear dependencies and assuring highly balanced usage of all generator stages are also introduced.
Index Terms:
Built-In Self-Test, Linear Dependencies, Phase Shifters, Test Pattern Generators
Citation:
Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski, "Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators," vts, pp.377, 18th IEEE VLSI Test Symposium (VTS'00), 2000
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