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18th IEEE VLSI Test Symposium (VTS'00)
Montreal, Canada
April 30-May 04
ISBN: 0-7695-0613-5
B. Vinnakota, University of Minnesota
Andre Ivanov, University of British Columbia
An increasing number of implantable biomedical ICs and SOCs are emerging for use in a variety of novel both life- and non-life-critical applications. Obviously, these need to undergo rigorous testing, or do they? This panel will discuss the testing of such devices, highlighting the similarities and differences between testing biomedical devices and other more common application devices. State of the art will be reviewed and research opportunities identified for this rapidly growing semiconductor market segment.
Citation:
B. Vinnakota, Andre Ivanov, "Biomedical ICs: What is Different about Testing those ICs?," vts, pp.329, 18th IEEE VLSI Test Symposium (VTS'00), 2000
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