Detection of Inter-Port Faults in Multi-Port Static RAMs

V
VTS
2000
18th IEEE VLSI Test Symposium (VTS'00)
Abstract - Detection of Inter-Port Faults in Multi-Port Static RAMs

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18th IEEE VLSI Test Symposium (VTS'00)

Montreal, Canada

April 30-May 04

ISBN: 0-7695-0613-5

	ASCII Text	x
	J. Zhao, S. Irrinki, M. Puri, F. Lombardi, "Detection of Inter-Port Faults in Multi-Port Static RAMs," VLSI Test Symposium, IEEE, pp. 297, 18th IEEE VLSI Test Symposium (VTS'00), 2000.

	BibTex	x
	@article{ 10.1109/VTEST.2000.843858, author = {J. Zhao and S. Irrinki and M. Puri and F. Lombardi}, title = {Detection of Inter-Port Faults in Multi-Port Static RAMs}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2000}, issn = {1093-0167}, pages = {297}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2000.843858}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Detection of Inter-Port Faults in Multi-Port Static RAMs SN - 1093-0167 SP EP A1 - J. Zhao, A1 - S. Irrinki, A1 - M. Puri, A1 - F. Lombardi, PY - 2000 VL - 0 JA - VLSI Test Symposium, IEEE ER -

J. Zhao, Texas A&M University

S. Irrinki, LSI Logic Inc.

M. Puri, LSI Logic Inc.

F. Lombardi, Northeastern University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.2000.843858

This paper deals with testing of inter-port faults in multi-port Static Random Access Memories (SRAMs). A inter-port fault is caused by a short between word/bit lines of different ports in a multi-port SRAM. By considering different implementations of the SRAM and its layout, an approach, which achieves 100 % coverage of fault detection, is proposed.This two-step approach is based on two novel algorithms, MMCA (Modified March C Algorithm) and WIPD (Write Inter-Port Detection). It is shown that inter-port fault detection is a combinatorial problem; hence, MMCA and WIPD must be executed multiple times depending on the types, number of ports and line arrangement in the layout.

Citation:

J. Zhao, S. Irrinki, M. Puri, F. Lombardi, "Detection of Inter-Port Faults in Multi-Port Static RAMs," vts, pp.297, 18th IEEE VLSI Test Symposium (VTS'00), 2000

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