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18th IEEE VLSI Test Symposium (VTS'00)
Testing, Verification, and Diagnosis in the Presence of Unknowns
Montreal, Canada
April 30-May 04
ISBN: 0-7695-0613-5
ASCII Text
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A. Jain, V. Boppana, R. Mukherjee, J. Jain, M. ~Fujita, M. Hsiao, "Testing, Verification, and Diagnosis in the Presence of Unknowns," VLSI Test Symposium, IEEE, pp. 263, 18th IEEE VLSI Test Symposium (VTS'00), 2000.
 
 
BibTex
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@article{ 10.1109/VTEST.2000.843854,
author = {A. Jain and V. Boppana and R. Mukherjee and J. Jain and M. ~Fujita and M. Hsiao},
title = {Testing, Verification, and Diagnosis in the Presence of Unknowns},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2000},
issn = {1093-0167},
pages = {263},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2000.843854},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Testing, Verification, and Diagnosis in the Presence of Unknowns
SN - 1093-0167
SP
EP
A1 - A. Jain,
A1 - V. Boppana,
A1 - R. Mukherjee,
A1 - J. Jain,
A1 - M. ~Fujita,
A1 - M. Hsiao,
PY - 2000
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
A. Jain, Intel Corp.
V. Boppana, Fujitsu Labs. of America, Inc.
R. Mukherjee, Fujitsu Labs. of America, Inc.
J. Jain, Fujitsu Labs. of America, Inc.
M. ~Fujita, Fujitsu Labs. of America, Inc.
M. Hsiao, Rutgers University
Improvement of the accuracy of error and fault diagnosis as well as ATPG for IP-based designs is important problems in industry. In this paper, we address these problems when portions of the design may be unspecified. Two approaches to solve these problems have been presented: (1) solving Boolean satisfiability under unknown constraints, and (2) a network modification-based solution. Experimental results on constrained equivalence checking, enhancement of error diagnosis resolution for combinational circuits, and ATPG for IP-based designs have been presented on the ISCAS 85 benchmark and industrial circuits.
Citation:
A. Jain, V. Boppana, R. Mukherjee, J. Jain, M. ~Fujita, M. Hsiao, "Testing, Verification, and Diagnosis in the Presence of Unknowns," vts, pp.263, 18th IEEE VLSI Test Symposium (VTS'00), 2000
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