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18th IEEE VLSI Test Symposium (VTS'00)
Thermal Testing: Fault Location Strategies
Montreal, Canada
April 30-May 04
ISBN: 0-7695-0613-5
ASCII Text
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J. Altet, A. Rubio, E. Schaub, S. Dialhaire, W. Claeys, "Thermal Testing: Fault Location Strategies," VLSI Test Symposium, IEEE, pp. 189, 18th IEEE VLSI Test Symposium (VTS'00), 2000.
 
 
BibTex
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@article{ 10.1109/VTEST.2000.843844,
author = {J. Altet and A. Rubio and E. Schaub and S. Dialhaire and W. Claeys},
title = {Thermal Testing: Fault Location Strategies},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2000},
issn = {1093-0167},
pages = {189},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2000.843844},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Thermal Testing: Fault Location Strategies
SN - 1093-0167
SP
EP
A1 - J. Altet,
A1 - A. Rubio,
A1 - E. Schaub,
A1 - S. Dialhaire,
A1 - W. Claeys,
PY - 2000
KW - Thermal Testing
KW - Temperature Measurements
KW - Built-In Differential Temperature Sensors
KW - Fault Location
KW - Mixed-Signal Circuits
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
J. Altet, Polytechnical University of Catalonia (UPC)
A. Rubio, Polytechnical University of Catalonia (UPC)
E. Schaub, Universite Bordeaux 1
S. Dialhaire, Universite Bordeaux 1
W. Claeys, Universite Bordeaux 1
By measuring the temperature at some points of an IC during a test procedure, defects can be detected (fault testing). With a simple processing of the measured temperature waveform, the distance between the temperature monitoring point and the activated defect can be derived. This paper presents four temperature-measuring strategies to determine this distance for diagnosis purposes.
Index Terms:
Thermal Testing, Temperature Measurements, Built-In Differential Temperature Sensors, Fault Location, Mixed-Signal Circuits
Citation:
J. Altet, A. Rubio, E. Schaub, S. Dialhaire, W. Claeys, "Thermal Testing: Fault Location Strategies," vts, pp.189, 18th IEEE VLSI Test Symposium (VTS'00), 2000
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