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1999 17TH IEEE VLSI Test Symposium
Programmable Embedded Self-Testing Checkers for All-Unidirectional Error-Detecting Codes
San Diego, California
April 26-April 30
ISBN: 0-7695-0146-X
Albrecht P. Stroele, University of Karlsruhe
Steffen Tarnick, SATCON GmbH
Code checkers monitor the outputs of a system in order to detect errors as soon as possible. The presented checker designs for m-out-of-n and Berger codes are well suited for use as embedded checkers since under very weak assumptions they are self-testing with respect to all single stuck-at faults and almost all combinational faults in a single cell. They are built from full adders and flip-flops and have a regular structure. The same checker circuit can be employed for m-out-of-n codes with different values of m. Also, the same circuit can be used for different types of Berger codes. The specific code is determined by the initialization of the checker register.
Citation:
Albrecht P. Stroele, Steffen Tarnick, "Programmable Embedded Self-Testing Checkers for All-Unidirectional Error-Detecting Codes," vts, pp.361, 1999 17TH IEEE VLSI Test Symposium, 1999
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