Y. Zorian, V. Rayapati, J. Miranda, S. Davidson, P. Dziel, S. Adham, S. Millman,
"Test Reuse at System Level,"
VLSI Test Symposium, IEEE, pp. 318, 16th IEEE VLSI Test Symposium, 1998.
BibTex
x
@article{
10.1109/VTS.1998.10014, author = {Y. Zorian and V. Rayapati and J. Miranda and S. Davidson and P. Dziel and S. Adham and S. Millman}, title = {Test Reuse at System Level}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1998}, issn = {1093-0167}, pages = {318}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.1998.10014}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - VLSI Test Symposium, IEEE TI - Test Reuse at System Level SN - 1093-0167 SP EP A1 - Y. Zorian, A1 - V. Rayapati, A1 - J. Miranda, A1 - S. Davidson, A1 - P. Dziel, A1 - S. Adham, A1 - S. Millman, PY - 1998 VL - 0 JA - VLSI Test Symposium, IEEE ER -
Y. Zorian, V. Rayapati, J. Miranda, S. Davidson, P. Dziel, S. Adham, S. Millman, "Test Reuse at System Level," vts, pp.318, 16th IEEE VLSI Test Symposium, 1998
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb