S. Majumder, V.D. Agrawal, M.L. Bushnell, "9.2 On Delay-Untestable Paths and Stuck-Fault Redundancy," VLSI Test Symposium, IEEE, pp. 194, 16th IEEE VLSI Test Symposium, 1998.

@article{ 10.1109/VTEST.1998.670868,
author = {S. Majumder and V.D. Agrawal and M.L. Bushnell},
title = {9.2 On Delay-Untestable Paths and Stuck-Fault Redundancy},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1998},
issn = {1093-0167},
pages = {194},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1998.670868},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - VLSI Test Symposium, IEEE
TI - 9.2 On Delay-Untestable Paths and Stuck-Fault Redundancy
SN - 1093-0167
SP
EP
A1 - S. Majumder,
A1 - V.D. Agrawal,
A1 - M.L. Bushnell,
PY - 1998
VL - 0
JA - VLSI Test Symposium, IEEE
ER -