H. Yotsuyanagi, K. Kinoshita, "8.4 Undetectable Fault Removal of Sequential Circuits Based on Unreachable States," VLSI Test Symposium, IEEE, pp. 176, 16th IEEE VLSI Test Symposium, 1998.

@article{ 10.1109/VTEST.1998.670866,
author = {H. Yotsuyanagi and K. Kinoshita},
title = {8.4 Undetectable Fault Removal of Sequential Circuits Based on Unreachable States},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1998},
issn = {1093-0167},
pages = {176},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1998.670866},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - VLSI Test Symposium, IEEE
TI - 8.4 Undetectable Fault Removal of Sequential Circuits Based on Unreachable States
SN - 1093-0167
SP
EP
A1 - H. Yotsuyanagi,
A1 - K. Kinoshita,
PY - 1998
VL - 0
JA - VLSI Test Symposium, IEEE
ER -