An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing

V
VTS
1997
15th IEEE VLSI Test Symposium (VTS'97)
Abstract - An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing

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15th IEEE VLSI Test Symposium (VTS'97)

Monterey, California

April 27-May 01

ISBN: 0-8186-7810-0

	ASCII Text	x
	P. Nigh, W. Needham, K. Butler, P. Maxwell, R. Aitken, "An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing," VLSI Test Symposium, IEEE, pp. 459, 15th IEEE VLSI Test Symposium (VTS'97), 1997.

	BibTex	x
	@article{ 10.1109/VTEST.1997.600334, author = {P. Nigh and W. Needham and K. Butler and P. Maxwell and R. Aitken}, title = {An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1997}, isbn = {0-8186-7810-0}, pages = {459}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1997.600334}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing SN - 0-8186-7810-0 SP EP A1 - P. Nigh, A1 - W. Needham, A1 - K. Butler, A1 - P. Maxwell, A1 - R. Aitken, PY - 1997 KW - application specific integrated circuits; functional testing; scan testing; IDDQ testing; delay-fault testing; semiconductor testing; stuck-fault testing; ASIC device VL - 0 JA - VLSI Test Symposium, IEEE ER -

P. Nigh, IBM

W. Needham, IBM

K. Butler, IBM

P. Maxwell, IBM

R. Aitken, IBM

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.1997.600334

This paper describes an experiment in which various semiconductor test methodologies (stuck-fault, functional, delay and IDDq) are applied to an ASIC device. The goal of this project is to provide the data that will enable manufacturers to optimize their application of the various tests. This project was supported through SEMATECH (Project S-121, "Semiconductor Test Method Evaluation ").

Index Terms:

application specific integrated circuits; functional testing; scan testing; IDDQ testing; delay-fault testing; semiconductor testing; stuck-fault testing; ASIC device

Citation:

P. Nigh, W. Needham, K. Butler, P. Maxwell, R. Aitken, "An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing," vts, pp.459, 15th IEEE VLSI Test Symposium (VTS'97), 1997

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