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15th IEEE VLSI Test Symposium (VTS'97)
On Optimizing BIST-Architecture by Using OBDD-based Approaches and Genetic Algorithms
Monterey, California
April 27-May 01
ISBN: 0-8186-7810-0
ASCII Text
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Can Oekmen, Martin Keim, Rolf Krieger, Bernd Becker, "On Optimizing BIST-Architecture by Using OBDD-based Approaches and Genetic Algorithms," VLSI Test Symposium, IEEE, pp. 426, 15th IEEE VLSI Test Symposium (VTS'97), 1997.
 
 
BibTex
x
 
@article{ 10.1109/VTEST.1997.600327,
author = {Can Oekmen and Martin Keim and Rolf Krieger and Bernd Becker},
title = {On Optimizing BIST-Architecture by Using OBDD-based Approaches and Genetic Algorithms},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1997},
isbn = {0-8186-7810-0},
pages = {426},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1997.600327},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - On Optimizing BIST-Architecture by Using OBDD-based Approaches and Genetic Algorithms
SN - 0-8186-7810-0
SP
EP
A1 - Can Oekmen,
A1 - Martin Keim,
A1 - Rolf Krieger,
A1 - Bernd Becker,
PY - 1997
KW - Build in self test (BIST)
KW - genetic algorithm
KW - input probability
KW - weighted random pattern generation (WRPG)
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Can Oekmen, Institute of Computer Science Albert-Ludwigs-University
Martin Keim, Institute of Computer Science Albert-Ludwigs-University
Rolf Krieger, Institute of Computer Science Albert-Ludwigs-University
Bernd Becker, Institute of Computer Science Albert-Ludwigs-University
We introduce a two-staged Genetic Algorithm for optimizing weighted random pattern testing in a Built-In-Self-Test (BIST) environment. The first stage includes the OBDD-based optimization of input probabilities with regard to the expected test length. The optimization itself is constrained to discrete weight values which can directly be integrated in a BIST environment. During the second stage, the hardware-design of the actual BIST-structure is optimized. Experimental results are given to demonstrate the quality of our approach.
Index Terms:
Build in self test (BIST), genetic algorithm, input probability, weighted random pattern generation (WRPG)
Citation:
Can Oekmen, Martin Keim, Rolf Krieger, Bernd Becker, "On Optimizing BIST-Architecture by Using OBDD-based Approaches and Genetic Algorithms," vts, pp.426, 15th IEEE VLSI Test Symposium (VTS'97), 1997
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