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15th IEEE VLSI Test Symposium (VTS'97)
Built-in parametric test for controlled impedance I/Os
Monterey, California
April 27-May 01
ISBN: 0-8186-7810-0
ASCII Text
x 
 
T. Haulin, "Built-in parametric test for controlled impedance I/Os," VLSI Test Symposium, IEEE, pp. 123, 15th IEEE VLSI Test Symposium (VTS'97), 1997.
 
 
BibTex
x
 
@article{ 10.1109/VTEST.1997.599461,
author = {T. Haulin},
title = {Built-in parametric test for controlled impedance I/Os},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1997},
isbn = {0-8186-7810-0},
pages = {123},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1997.599461},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Built-in parametric test for controlled impedance I/Os
SN - 0-8186-7810-0
SP
EP
A1 - T. Haulin,
PY - 1997
KW - built-in self test; controlled impedance I/Os; built-in parametric test; functional test; full DC parametrics; full speed AC tests; lower cost ATE; differential signal I/Os; single-ended signal I/Os; short circuit proof drivers; B9 test method; bidirectional I/O; differential receivers; differential transmitters; static tests; boundary scan; diagnostic tests; narrow pulse test; contact test; high speed test logic
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
T. Haulin, Ericsson Telecom AB, Stockholm, Sweden
A test method for functional and parametric test of I/Os has been developed. This method allows I/Os to be tested in parallel by use of a common DC supply instead of individual tester channels and pin electronics. Full DC parametrics on inputs and outputs, and full speed AC tests, can be performed on lower cost ATE. Both single-ended and differential signal I/Os are handled. Differential measurements are taken on differential I/Os. This test method works on I/Os using short circuit proof drivers with controlled impedance.
Index Terms:
built-in self test; controlled impedance I/Os; built-in parametric test; functional test; full DC parametrics; full speed AC tests; lower cost ATE; differential signal I/Os; single-ended signal I/Os; short circuit proof drivers; B9 test method; bidirectional I/O; differential receivers; differential transmitters; static tests; boundary scan; diagnostic tests; narrow pulse test; contact test; high speed test logic
Citation:
T. Haulin, "Built-in parametric test for controlled impedance I/Os," vts, pp.123, 15th IEEE VLSI Test Symposium (VTS'97), 1997
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