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14th IEEE VLSI Test Symposium (VTS '96)
Analog circuit simulation and troubleshooting with FLAMES
Princeton, NJ
April 28-May 01
ISBN: 0-8186-7304-4
ASCII Text
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F. Mohamed, M. Manzouki, A. Biassizo, F. Novak, "Analog circuit simulation and troubleshooting with FLAMES," VLSI Test Symposium, IEEE, pp. 495, 14th IEEE VLSI Test Symposium (VTS '96), 1996.
 
 
BibTex
x
 
@article{ 10.1109/VTEST.1996.510899,
author = {F. Mohamed and M. Manzouki and A. Biassizo and F. Novak},
title = {Analog circuit simulation and troubleshooting with FLAMES},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1996},
isbn = {0-8186-7304-4},
pages = {495},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1996.510899},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Analog circuit simulation and troubleshooting with FLAMES
SN - 0-8186-7304-4
SP
EP
A1 - F. Mohamed,
A1 - M. Manzouki,
A1 - A. Biassizo,
A1 - F. Novak,
PY - 1996
KW - analogue integrated circuits; integrated circuit testing; VLSI; circuit analysis computing; fuzzy logic; diagnostic expert systems; analog circuit simulation; troubleshooting; FLAMES; fuzzy logic; model-based expert system
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
F. Mohamed, TIMA Lab., Grenoble, France
M. Manzouki, TIMA Lab., Grenoble, France
A. Biassizo, TIMA Lab., Grenoble, France
F. Novak, TIMA Lab., Grenoble, France
A new approach for analog circuit simulation and troubleshooting, based on the fuzzy logic paradigm, is presented in this paper. This approach allows to deal with soft faults, single or multiple ones, and with both impreciseness and uncertainty of information. It has been implemented in a system named FLAMES (Fuzzy Logic ATMS and Model-based Expert System), of which details are provided, together with different experimental results, for both simulation and troubleshooting processes.
Index Terms:
analogue integrated circuits; integrated circuit testing; VLSI; circuit analysis computing; fuzzy logic; diagnostic expert systems; analog circuit simulation; troubleshooting; FLAMES; fuzzy logic; model-based expert system
Citation:
F. Mohamed, M. Manzouki, A. Biassizo, F. Novak, "Analog circuit simulation and troubleshooting with FLAMES," vts, pp.495, 14th IEEE VLSI Test Symposium (VTS '96), 1996
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