Monitoring power dissipation for fault detection

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14th IEEE VLSI Test Symposium (VTS '96)

Princeton, NJ

April 28-May 01

ISBN: 0-8186-7304-4

	ASCII Text	x
	B. Vinnakota, "Monitoring power dissipation for fault detection," VLSI Test Symposium, IEEE, pp. 483, 14th IEEE VLSI Test Symposium (VTS '96), 1996.

	BibTex	x
	@article{ 10.1109/VTEST.1996.510897, author = {B. Vinnakota}, title = {Monitoring power dissipation for fault detection}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1996}, isbn = {0-8186-7304-4}, pages = {483}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1996.510897}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Monitoring power dissipation for fault detection SN - 0-8186-7304-4 SP EP A1 - B. Vinnakota, PY - 1996 KW - CMOS integrated circuits; fault location; monitoring; frequency-domain analysis; integrated circuit testing; VLSI; power dissipation; fault detection; frequency domain analysis; test vectors; power monitoring; CMOS IC testing VL - 0 JA - VLSI Test Symposium, IEEE ER -

B. Vinnakota, Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.1996.510897

In this paper, we suggest that the dynamic power dissipation of a circuit can be used to detect faults in it. The change in dissipation caused by a fault can be maximized by applying specific test vectors. For example circuits, we show that the power dissipation can be used to detect faults which do not affect static power dissipation. We also discuss how faults may be detected with a frequency domain analysis. In many cases, the Fourier spectra of the power supply currents in the good and faulty circuits will be very different. Power monitoring is also verified experimentally, for an example circuit.

Index Terms:

CMOS integrated circuits; fault location; monitoring; frequency-domain analysis; integrated circuit testing; VLSI; power dissipation; fault detection; frequency domain analysis; test vectors; power monitoring; CMOS IC testing

Citation:

B. Vinnakota, "Monitoring power dissipation for fault detection," vts, pp.483, 14th IEEE VLSI Test Symposium (VTS '96), 1996

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