Consistently dominant fault model for tristate buffer nets

V
VTS
1996
14th IEEE VLSI Test Symposium (VTS '96)
Abstract - Consistently dominant fault model for tristate buffer nets

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14th IEEE VLSI Test Symposium (VTS '96)

Princeton, NJ

April 28-May 01

ISBN: 0-8186-7304-4

	ASCII Text	x
	T.J. Powell, "Consistently dominant fault model for tristate buffer nets," VLSI Test Symposium, IEEE, pp. 400, 14th IEEE VLSI Test Symposium (VTS '96), 1996.

	BibTex	x
	@article{ 10.1109/VTEST.1996.510885, author = {T.J. Powell}, title = {Consistently dominant fault model for tristate buffer nets}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1996}, isbn = {0-8186-7304-4}, pages = {400}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1996.510885}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Consistently dominant fault model for tristate buffer nets SN - 0-8186-7304-4 SP EP A1 - T.J. Powell, PY - 1996 KW - fault diagnosis; logic testing; integrated logic circuits; integrated circuit testing; VLSI; fault location; buffer circuits; ternary logic; multivalued logic circuits; consistently dominant fault model; tristate buffer nets; floating type faults; contention type faults; MISR signature loss; test pattern compression; fault detection; stuck faults VL - 0 JA - VLSI Test Symposium, IEEE ER -

T.J. Powell, Texas Instrum. Inc., Dallas, TX, USA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.1996.510885

Unknown values result from floating and contention type faults on tristate buffer nets thereby causing MISR signature loss during test pattern compression. A Consistently Dominant Fault model is presented that removes the problem and permits fault detection of several problem tristate buffer stuck faults.

Index Terms:

fault diagnosis; logic testing; integrated logic circuits; integrated circuit testing; VLSI; fault location; buffer circuits; ternary logic; multivalued logic circuits; consistently dominant fault model; tristate buffer nets; floating type faults; contention type faults; MISR signature loss; test pattern compression; fault detection; stuck faults

Citation:

T.J. Powell, "Consistently dominant fault model for tristate buffer nets," vts, pp.400, 14th IEEE VLSI Test Symposium (VTS '96), 1996

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