Improving the accuracy of diagnostics provided by fault dictionaries

V
VTS
1996
14th IEEE VLSI Test Symposium (VTS '96)
Abstract - Improving the accuracy of diagnostics provided by fault dictionaries

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14th IEEE VLSI Test Symposium (VTS '96)

Princeton, NJ

April 28-May 01

ISBN: 0-8186-7304-4

	ASCII Text	x
	J.W. Sheppard, W.R. Simpson, "Improving the accuracy of diagnostics provided by fault dictionaries," VLSI Test Symposium, IEEE, pp. 180, 14th IEEE VLSI Test Symposium (VTS '96), 1996.

	BibTex	x
	@article{ 10.1109/VTEST.1996.510855, author = {J.W. Sheppard and W.R. Simpson}, title = {Improving the accuracy of diagnostics provided by fault dictionaries}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1996}, isbn = {0-8186-7304-4}, pages = {180}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1996.510855}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Improving the accuracy of diagnostics provided by fault dictionaries SN - 0-8186-7304-4 SP EP A1 - J.W. Sheppard, A1 - W.R. Simpson, PY - 1996 KW - fault diagnosis; logic testing; digital integrated circuits; integrated circuit testing; automatic testing; circuit analysis computing; VLSI; diagnostics accuracy improvement; fault dictionaries; nearest neighbor classification; digital circuit diagnosis; information flow model VL - 0 JA - VLSI Test Symposium, IEEE ER -

J.W. Sheppard, ARINC Res. Corp., Annapolis, MD, USA

W.R. Simpson, ARINC Res. Corp., Annapolis, MD, USA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.1996.510855

Using nearest neighbor classification with fault dictionaries to resolve inexact signature matches in digital circuit diagnosis is inadequate. Nearest neighbor focuses on the possible diagnoses rather than on the tests. Our alternative-the information flow model-focuses on test information in the fault dictionary to provide more accurate diagnostics.

Index Terms:

fault diagnosis; logic testing; digital integrated circuits; integrated circuit testing; automatic testing; circuit analysis computing; VLSI; diagnostics accuracy improvement; fault dictionaries; nearest neighbor classification; digital circuit diagnosis; information flow model

Citation:

J.W. Sheppard, W.R. Simpson, "Improving the accuracy of diagnostics provided by fault dictionaries," vts, pp.180, 14th IEEE VLSI Test Symposium (VTS '96), 1996

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