Improving the efficiency of error identification via signature analysis

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	Similar Articles Articles by C.E. Stroud Articles by T.R. Damarla

13th IEEE VLSI Test Symposium (VTS'95)

Princeton, New Jersey

April 30-May 03

ISBN: 0-8186-7000-2

	ASCII Text	x
	C.E. Stroud, T.R. Damarla, "Improving the efficiency of error identification via signature analysis," VLSI Test Symposium, IEEE, pp. 0244, 13th IEEE VLSI Test Symposium (VTS'95), 1995.

	BibTex	x
	@article{ 10.1109/VTEST.1995.512644, author = {C.E. Stroud and T.R. Damarla}, title = {Improving the efficiency of error identification via signature analysis}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1995}, isbn = {0-8186-7000-2}, pages = {0244}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1995.512644}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Improving the efficiency of error identification via signature analysis SN - 0-8186-7000-2 SP EP A1 - C.E. Stroud, A1 - T.R. Damarla, PY - 1995 KW - VLSI; built-in self test; integrated circuit testing; fault diagnosis; logic testing; error identification; signature analysis; single bit errors; input polynomial; characteristic polynomial; least common multiple; diagnostic aliasing; multiple bit errors; nonprimitive polynomials; BIST; VLSI VL - 0 JA - VLSI Test Symposium, IEEE ER -

C.E. Stroud, Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA

T.R. Damarla, Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.1995.512644

Abstract: Efficient identification of all single bit errors in the input polynomial to signature analysis registers is achieved by using characteristic polynomial f(x)=f/sub a/(x)f/sub b/(x) where f/sub a/(x) and f/sub b/(x) have different degrees and are of the form f/sub n/(x)=x/sup n/+x/sup n-1/+1. The input polynomial must be of degree >lcm(ord(f/sub a/(x)), ord(f/sub b/(x))), where lcm denotes the least common multiple. Diagnostic aliasing for multiple bit errors is reduced by using non-primitive polynomials for f/sub a/(x) and/or f/sub b/(x).

Index Terms:

VLSI; built-in self test; integrated circuit testing; fault diagnosis; logic testing; error identification; signature analysis; single bit errors; input polynomial; characteristic polynomial; least common multiple; diagnostic aliasing; multiple bit errors; nonprimitive polynomials; BIST; VLSI

Citation:

C.E. Stroud, T.R. Damarla, "Improving the efficiency of error identification via signature analysis," vts, pp.0244, 13th IEEE VLSI Test Symposium (VTS'95), 1995

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