Fault coverage analysis of RAM test algorithms

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	Similar Articles Articles by M. Riedel Articles by J. Rajski

13th IEEE VLSI Test Symposium (VTS'95)

Princeton, New Jersey

April 30-May 03

ISBN: 0-8186-7000-2

	ASCII Text	x
	M. Riedel, J. Rajski, "Fault coverage analysis of RAM test algorithms," VLSI Test Symposium, IEEE, pp. 0227, 13th IEEE VLSI Test Symposium (VTS'95), 1995.

	BibTex	x
	@article{ 10.1109/VTEST.1995.512642, author = {M. Riedel and J. Rajski}, title = {Fault coverage analysis of RAM test algorithms}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1995}, isbn = {0-8186-7000-2}, pages = {0227}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1995.512642}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Fault coverage analysis of RAM test algorithms SN - 0-8186-7000-2 SP EP A1 - M. Riedel, A1 - J. Rajski, PY - 1995 KW - random-access storage; integrated circuit testing; integrated memory circuits; fault diagnosis; RAM test algorithms; fault coverage; flexible software analysis program; arbitrary test sequences; coverage statistics; functional cell-array faults; fault state transition conditions; representative fault classes; test algorithms; semiconductor memories VL - 0 JA - VLSI Test Symposium, IEEE ER -

M. Riedel, MACS Lab., McGill Univ., Montreal, Que., Canada

J. Rajski, MACS Lab., McGill Univ., Montreal, Que., Canada

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.1995.512642

Abstract: A methodology for evaluating the fault coverage of RAM test algorithms is proposed and the architecture of a flexible software analysis program is described. The analysis, performed for arbitrary test sequences, provides a comprehensive set of coverage statistics for functional cell-array faults. An overview of the analysis capabilities of the program is given, the fault state transition conditions for several representative fault classes are specified, and coverage analyses results for a variety of test algorithms are presented.

Index Terms:

random-access storage; integrated circuit testing; integrated memory circuits; fault diagnosis; RAM test algorithms; fault coverage; flexible software analysis program; arbitrary test sequences; coverage statistics; functional cell-array faults; fault state transition conditions; representative fault classes; test algorithms; semiconductor memories

Citation:

M. Riedel, J. Rajski, "Fault coverage analysis of RAM test algorithms," vts, pp.0227, 13th IEEE VLSI Test Symposium (VTS'95), 1995

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