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13th IEEE VLSI Test Symposium (VTS'95)
Self-test in a VCM driver chip
Princeton, New Jersey
April 30-May 03
ISBN: 0-8186-7000-2
ASCII Text
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L. Sebaa, N. Gardner, R. Neidorff, R. Valley, "Self-test in a VCM driver chip," VLSI Test Symposium, IEEE, pp. 0066, 13th IEEE VLSI Test Symposium (VTS'95), 1995.
 
 
BibTex
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@article{ 10.1109/VTEST.1995.512619,
author = {L. Sebaa and N. Gardner and R. Neidorff and R. Valley},
title = {Self-test in a VCM driver chip},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1995},
isbn = {0-8186-7000-2},
pages = {0066},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1995.512619},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Self-test in a VCM driver chip
SN - 0-8186-7000-2
SP
EP
A1 - L. Sebaa,
A1 - N. Gardner,
A1 - R. Neidorff,
A1 - R. Valley,
PY - 1995
KW - driver circuits; bridge circuits; built-in self test; integrated circuit testing; design for testability; mixed analogue-digital integrated circuits; instrumentation amplifiers; digital-analogue conversion; pulse amplifiers; VCM driver chip; self-test mode; complex mixed-signal device; device under test; voice-coil motor; H-bridge amplifier; onchip D/A converter; self-test circuitry; 11 bit
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
L. Sebaa, Western Digital Corp., Irvine, CA, USA
N. Gardner, Western Digital Corp., Irvine, CA, USA
R. Neidorff, Western Digital Corp., Irvine, CA, USA
R. Valley, Western Digital Corp., Irvine, CA, USA
Abstract: This paper describes a cost effective self-test mode in a complex mixed-signal device. The device under test (DUT) is a Voice-Coil Motor (VCM) H-bridge amplifier with an onchip 11-bit D/A converter. The self-test mode can be initiated at the chip, board and system levels of testing and troubleshooting. The added self-test circuitry does not induce any noticeable silicon overhead.
Index Terms:
driver circuits; bridge circuits; built-in self test; integrated circuit testing; design for testability; mixed analogue-digital integrated circuits; instrumentation amplifiers; digital-analogue conversion; pulse amplifiers; VCM driver chip; self-test mode; complex mixed-signal device; device under test; voice-coil motor; H-bridge amplifier; onchip D/A converter; self-test circuitry; 11 bit
Citation:
L. Sebaa, N. Gardner, R. Neidorff, R. Valley, "Self-test in a VCM driver chip," vts, pp.0066, 13th IEEE VLSI Test Symposium (VTS'95), 1995
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