Frequency-based BIST for analog circuit testing

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	Similar Articles Articles by S. Khaled Articles by B. Kaminska Articles by B. Courtois Articles by M. Lubaszewski

13th IEEE VLSI Test Symposium (VTS'95)

Princeton, New Jersey

April 30-May 03

ISBN: 0-8186-7000-2

	ASCII Text	x
	S. Khaled, B. Kaminska, B. Courtois, M. Lubaszewski, "Frequency-based BIST for analog circuit testing," VLSI Test Symposium, IEEE, pp. 0054, 13th IEEE VLSI Test Symposium (VTS'95), 1995.

	BibTex	x
	@article{ 10.1109/VTEST.1995.512617, author = {S. Khaled and B. Kaminska and B. Courtois and M. Lubaszewski}, title = {Frequency-based BIST for analog circuit testing}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1995}, isbn = {0-8186-7000-2}, pages = {0054}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1995.512617}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Frequency-based BIST for analog circuit testing SN - 0-8186-7000-2 SP EP A1 - S. Khaled, A1 - B. Kaminska, A1 - B. Courtois, A1 - M. Lubaszewski, PY - 1995 KW - built-in self test; analogue integrated circuits; integrated circuit testing; VLSI; waveform generators; frequency-based BIST; analog circuit testing; VLSI; sine wave generator; sinusoidal input signals; variable frequency input stimulus; frequency input signal; T-BIST approach; frequency-counter BIST approach VL - 0 JA - VLSI Test Symposium, IEEE ER -

S. Khaled, Ecole Polytech., Montreal, Que., Canada

B. Kaminska, Ecole Polytech., Montreal, Que., Canada

B. Courtois, Ecole Polytech., Montreal, Que., Canada

M. Lubaszewski, Ecole Polytech., Montreal, Que., Canada

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.1995.512617

Abstract: In this paper we propose a configuration for a VLSI analog sine wave generator with an appropriate frequency BIST. The generator is used for testing circuits that require sinusoidal input signals with a variable frequency as an input stimulus. The detectors indicate any deviation of the frequency input signal from the nominal value /spl plusmn//spl epsiv/. A sine wave generator and two different BISTs are proposed: the defection and translation (DandT) T-BIST approach and the frequency-counter BIST approach. Some experimental results are also presented.

Index Terms:

built-in self test; analogue integrated circuits; integrated circuit testing; VLSI; waveform generators; frequency-based BIST; analog circuit testing; VLSI; sine wave generator; sinusoidal input signals; variable frequency input stimulus; frequency input signal; T-BIST approach; frequency-counter BIST approach

Citation:

S. Khaled, B. Kaminska, B. Courtois, M. Lubaszewski, "Frequency-based BIST for analog circuit testing," vts, pp.0054, 13th IEEE VLSI Test Symposium (VTS'95), 1995

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