A solution for the on-line test of analog ladder filters

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by D. Vazquez Articles by A. Rueda Articles by J.L. Huertas

13th IEEE VLSI Test Symposium (VTS'95)

Princeton, New Jersey

April 30-May 03

ISBN: 0-8186-7000-2

	ASCII Text	x
	D. Vazquez, A. Rueda, J.L. Huertas, "A solution for the on-line test of analog ladder filters," VLSI Test Symposium, IEEE, pp. 0048, 13th IEEE VLSI Test Symposium (VTS'95), 1995.

	BibTex	x
	@article{ 10.1109/VTEST.1995.512616, author = {D. Vazquez and A. Rueda and J.L. Huertas}, title = {A solution for the on-line test of analog ladder filters}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1995}, isbn = {0-8186-7000-2}, pages = {0048}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1995.512616}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - A solution for the on-line test of analog ladder filters SN - 0-8186-7000-2 SP EP A1 - D. Vazquez, A1 - A. Rueda, A1 - J.L. Huertas, PY - 1995 KW - analogue integrated circuits; ladder filters; active filters; circuit stability; design for testability; integrated circuit testing; analog ladder filters; stability problems; design for test methodology; on-line testing; solution feasibility; analogue ICs; active filters VL - 0 JA - VLSI Test Symposium, IEEE ER -

D. Vazquez, Dpto. de Diseno Analogico, Univ. de Sevilla, Spain

A. Rueda, Dpto. de Diseno Analogico, Univ. de Sevilla, Spain

J.L. Huertas, Dpto. de Diseno Analogico, Univ. de Sevilla, Spain

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.1995.512616

Abstract: In this paper we study stability problems associated with the previously developed design for test (DFT) methodology applied to ladder filters. A solution based on simple modification of the basic DFT strategy is proposed which allows on-line testing of ladder filters. A filter example demonstrates the feasibility of the solution.

Index Terms:

analogue integrated circuits; ladder filters; active filters; circuit stability; design for testability; integrated circuit testing; analog ladder filters; stability problems; design for test methodology; on-line testing; solution feasibility; analogue ICs; active filters

Citation:

D. Vazquez, A. Rueda, J.L. Huertas, "A solution for the on-line test of analog ladder filters," vts, pp.0048, 13th IEEE VLSI Test Symposium (VTS'95), 1995

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.