loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design (VLSID'05)
False Path and Clock Scheduling Based Yield-Aware Gate Sizing
Kolkata, India
January 03-January 07
ISBN: 0-7695-2264-5
Jeng-Liang Tsai, University of Wisconsin-Madison
DongHyun Baik, University of Wisconsin-Madison
Charlie Chung-Ping Chen, National Taiwan University
Kewal K. Saluja, University of Wisconsin-Madison
Timing margin (slack) needs to be carefully managed to ensure a satisfactory timing yield. We propose a new design flow that combines a false-path-aware gate sizing and a statistical-timing-driven clock scheduling algorithms to maximize timing yield. Our gate sizing algorithm preserves the true path lengths that may otherwise be altered by the traditional gate sizing algorithms due to the presence of false paths. The slack is then distributed to each path according to its path delay uncertainty to maximize the timing yield. Experimental results show that our flow achieves significant timing yield improvements (> 20%) than a traditional flow for a subset of the benchmark circuits with little or negligible area penalty.
Citation:
Jeng-Liang Tsai, DongHyun Baik, Charlie Chung-Ping Chen, Kewal K. Saluja, "False Path and Clock Scheduling Based Yield-Aware Gate Sizing," vlsid, pp.423-426, 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design (VLSID'05), 2005
Usage of this product signifies your acceptance of the Terms of Use.