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18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design (VLSID'05)
Worst-Case Crosstalk Noise Analysis Based on Dual-Exponential Noise Metrics
Kolkata, India
January 03-January 07
ISBN: 0-7695-2264-5
ASCII Text
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Jiaxing Sun, Yun Zheng, Qing Ye, Tianchun Ye, "Worst-Case Crosstalk Noise Analysis Based on Dual-Exponential Noise Metrics," VLSI Design, International Conference on, pp. 348-353, 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design (VLSID'05), 2005.
 
 
BibTex
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@article{ 10.1109/ICVD.2005.173,
author = {Jiaxing Sun and Yun Zheng and Qing Ye and Tianchun Ye},
title = {Worst-Case Crosstalk Noise Analysis Based on Dual-Exponential Noise Metrics},
journal ={VLSI Design, International Conference on},
volume = {0},
year = {2005},
issn = {1063-9667},
pages = {348-353},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICVD.2005.173},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - VLSI Design, International Conference on
TI - Worst-Case Crosstalk Noise Analysis Based on Dual-Exponential Noise Metrics
SN - 1063-9667
SP348
EP353
A1 - Jiaxing Sun,
A1 - Yun Zheng,
A1 - Qing Ye,
A1 - Tianchun Ye,
PY - 2005
KW - crosstalk noise
KW - crosstalk noise metrics
KW - peak noise window
KW - worst-case crosstalk noise
VL - 0
JA - VLSI Design, International Conference on
ER -
 
Jiaxing Sun, Chinese Academy of Sciences
Yun Zheng, CEC Huada Electronic Design Co., Ltd.
Qing Ye, Chinese Academy of Sciences
Tianchun Ye, Chinese Academy of Sciences
Based on the assumption that crosstalk noise is dual-exponential waveform, in this paper we present the closed-form crosstalk noise metrics including the peak noise amplitude Vp, peak noise occurring time Tp and pulse width Wn. Then using part of our metrics we study aggressors switching times alignment that leads to worst-case crosstalk noise for a quiet victim from the analysis of peak noise window (PNW). The SPICE simulation results confirm the accuracy of our metrics and our analysis.
Index Terms:
crosstalk noise, crosstalk noise metrics, peak noise window, worst-case crosstalk noise
Citation:
Jiaxing Sun, Yun Zheng, Qing Ye, Tianchun Ye, "Worst-Case Crosstalk Noise Analysis Based on Dual-Exponential Noise Metrics," vlsid, pp.348-353, 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design (VLSID'05), 2005
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