Comparison of Effectiveness of Current Ratio and Delta-I<sub>DDQ</sub> Tests

V
VLSID
2004
17th International Conference on VLSI Design
Abstract - Comparison of Effectiveness of Current Ratio and Delta-I<sub>DDQ</sub> Tests

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17th International Conference on VLSI Design

Comparison of Effectiveness of Current Ratio and Delta-I_DDQ Tests

Mumbai, India

January 05-January 09

ISBN: 0-7695-2072-3

	ASCII Text	x
	Sagar S. Sabade, D. M. H. Walker, "Comparison of Effectiveness of Current Ratio and Delta-I<sub>DDQ</sub> Tests," VLSI Design, International Conference on, pp. 889, 17th International Conference on VLSI Design, 2004.

	BibTex	x
	@article{ 10.1109/ICVD.2004.1261043, author = {Sagar S. Sabade and D. M. H. Walker}, title = {Comparison of Effectiveness of Current Ratio and Delta-I<sub>DDQ</sub> Tests}, journal ={VLSI Design, International Conference on}, volume = {0}, year = {2004}, issn = {1063-9667}, pages = {889}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICVD.2004.1261043}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Design, International Conference on TI - Comparison of Effectiveness of Current Ratio and Delta-I<sub>DDQ</sub> Tests SN - 1063-9667 SP EP A1 - Sagar S. Sabade, A1 - D. M. H. Walker, PY - 2004 KW - null VL - 0 JA - VLSI Design, International Conference on ER -

Sagar S. Sabade, Texas A&M University

D. M. H. Walker, Texas A&M University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICVD.2004.1261043

I_DDQ test is a valuable test method for semiconductor manufacturers. However, its effectiveness is reduced for deep sub-micron technology chips due to rising background leakage. Current two test methods that promise to extend the life of I_DDQ test are Current Ratio and Delta-I_DDQ. Although several studies have been reported on these methods, their effectiveness in detecting defects has not been contrasted. In this work, we compare these two methods using industrial test data.

Citation:

Sagar S. Sabade, D. M. H. Walker, "Comparison of Effectiveness of Current Ratio and Delta-I_DDQ Tests," vlsid, pp.889, 17th International Conference on VLSI Design, 2004

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