Reset Careabouts in a SoC Design

V
VLSID
2004
17th International Conference on VLSI Design
Abstract - Reset Careabouts in a SoC Design

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17th International Conference on VLSI Design

Mumbai, India

January 05-January 09

ISBN: 0-7695-2072-3

	ASCII Text	x
	Subrangshu Das, Subash Chandar, Ashutosh Tiwari, "Reset Careabouts in a SoC Design," VLSI Design, International Conference on, pp. 788, 17th International Conference on VLSI Design, 2004.

	BibTex	x
	@article{ 10.1109/ICVD.2004.1261029, author = {Subrangshu Das and Subash Chandar and Ashutosh Tiwari}, title = {Reset Careabouts in a SoC Design}, journal ={VLSI Design, International Conference on}, volume = {0}, year = {2004}, issn = {1063-9667}, pages = {788}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICVD.2004.1261029}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Design, International Conference on TI - Reset Careabouts in a SoC Design SN - 1063-9667 SP EP A1 - Subrangshu Das, A1 - Subash Chandar, A1 - Ashutosh Tiwari, PY - 2004 KW - null VL - 0 JA - VLSI Design, International Conference on ER -

Subrangshu Das, Texas Instruments India Ltd.

Subash Chandar, Texas Instruments India Ltd.

Ashutosh Tiwari, Texas Instruments India Ltd.

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICVD.2004.1261029

Advances in VLSI technology have enabled designers to integrate more functionality in one chip. One of the major design complexities arising from this is defining the reset architecture for a SoC, especially when there are multiple clock domains. Incorrect assumptions or overlooked issues might cause silicon bugs requiring costly re-spins or even worse to a missed opportunity.

In this paper, various careabouts that help achieve first pass silicon success as well as reduced verification and manufacturing test generation effort with respect to the reset signal and the reset state are described.

Citation:

Subrangshu Das, Subash Chandar, Ashutosh Tiwari, "Reset Careabouts in a SoC Design," vlsid, pp.788, 17th International Conference on VLSI Design, 2004

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