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17th International Conference on VLSI Design
CMOS Scaling for sub-90 nm to sub-10 nm
Mumbai, India
January 05-January 09
ISBN: 0-7695-2072-3
Hiroshi Iwai, Tokyo Institute of Technology
Recently, CMOS downsizing has been accelerated very aggressively in both production and reseach level, and even transistor operation of a 6 nm gate length p-channel MOSFET was reported in a conference. However, many serious problems are expected for implementing such small-geometry MOSFETs into large scale integrated circuits, and it is still questionable whether we can successfully introduce sub-10 nm CMOS LSIs into market or not. In this paper, limitation and its possible causes for the downscaling of CMOS towards sub-10 nm are discussed with consideration of past CMOS predictions for the limitation.
Citation:
Hiroshi Iwai, "CMOS Scaling for sub-90 nm to sub-10 nm," vlsid, pp.30, 17th International Conference on VLSI Design, 2004
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