Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier Identification

V
VLSID
2003
16th International Conference on VLSI Design
Abstract - Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier Identification

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16th International Conference on VLSI Design

Immediate Neighbor Difference I_DDQ Test (INDIT) for Outlier Identification

New Delhi, India

January 04-January 08

ISBN: 0-7695-1868-0

	ASCII Text	x
	Sagar S. Sabade, D. M. H. Walker, "Immediate Neighbor Difference I<sub>DDQ</sub> Test (INDIT) for Outlier Identification," VLSI Design, International Conference on, pp. 361, 16th International Conference on VLSI Design, 2003.

	BibTex	x
	@article{ 10.1109/ICVD.2003.1183163, author = {Sagar S. Sabade and D. M. H. Walker}, title = {Immediate Neighbor Difference I<sub>DDQ</sub> Test (INDIT) for Outlier Identification}, journal ={VLSI Design, International Conference on}, volume = {0}, year = {2003}, issn = {1063-9667}, pages = {361}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICVD.2003.1183163}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Design, International Conference on TI - Immediate Neighbor Difference I<sub>DDQ</sub> Test (INDIT) for Outlier Identification SN - 1063-9667 SP EP A1 - Sagar S. Sabade, A1 - D. M. H. Walker, PY - 2003 KW - Keywords: I<sub>DDQ</sub> testing KW - delta I<sub>DDQ</sub> KW - spatial correlation VL - 0 JA - VLSI Design, International Conference on ER -

Sagar S. Sabade, Texas A&M University

D. M. H. Walker, Texas A&M University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICVD.2003.1183163

Increasing magnitude and variation in leakage current make it impossible to distinguish between faulty and fault-free chips using single threshold method. Neighboring chips on a wafer have similar fault-free properties. By obtaining differences in I_DDQ values it is possible to discriminate faulty dice. In this paper we describe a methodology in which comparison of I_DDQ of a die with that of its neighboring dice on the wafer is evaluated for screening faulty chips at the wafer level. The analysis based on the SEMATECH test data^? is presented.

Index Terms:

Keywords: IDDQ testing, delta IDDQ, spatial correlation

Citation:

Sagar S. Sabade, D. M. H. Walker, "Immediate Neighbor Difference I_DDQ Test (INDIT) for Outlier Identification," vlsid, pp.361, 16th International Conference on VLSI Design, 2003

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