A Novel Method to Improve the Test Efficiency of VLSI Tests

V
VLSID
2002
ASP-DAC/VLSI Design 2002
Abstract - A Novel Method to Improve the Test Efficiency of VLSI Tests

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ASP-DAC/VLSI Design 2002

Bangalore, India

January 07-January 11

ISBN: 0-7695-1441-3

	ASCII Text	x
	Hailong Cui, Sharad C. Seth, Shashank K. Mehta, "A Novel Method to Improve the Test Efficiency of VLSI Tests," VLSI Design, International Conference on, pp. 499, ASP-DAC/VLSI Design 2002, 2002.

	BibTex	x
	@article{ 10.1109/ASPDAC.2002.994969, author = {Hailong Cui and Sharad C. Seth and Shashank K. Mehta}, title = {A Novel Method to Improve the Test Efficiency of VLSI Tests}, journal ={VLSI Design, International Conference on}, volume = {0}, year = {2002}, isbn = {0-7695-1441-3}, pages = {499}, doi = {http://doi.ieeecomputersociety.org/10.1109/ASPDAC.2002.994969}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Design, International Conference on TI - A Novel Method to Improve the Test Efficiency of VLSI Tests SN - 0-7695-1441-3 SP EP A1 - Hailong Cui, A1 - Sharad C. Seth, A1 - Shashank K. Mehta, PY - 2002 VL - 0 JA - VLSI Design, International Conference on ER -

Hailong Cui, University of Nebraska-Lincoln

Sharad C. Seth, University of Nebraska-Lincoln

Shashank K. Mehta, Indian Institute of Technology

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ASPDAC.2002.994969

This paper considers reducing the cost of test application by permuting test vectors to improve their defect coverage. Algorithms for test reordering are developed with the goal of minimizing the test cost. Best and worst case bounds are established for the performance of a reordered sequence compared to the original sequence of test application. SEMATECH test data and simulation results are used throughout to illustrate the ideas.

Citation:

Hailong Cui, Sharad C. Seth, Shashank K. Mehta, "A Novel Method to Improve the Test Efficiency of VLSI Tests," vlsid, pp.499, ASP-DAC/VLSI Design 2002, 2002

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