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XXI International Conference of the Chilean Computer Science Society (SCCC'01)
Empirical Validation of Class Diagram Complexity Metrics
Punta Arenas, Chile
November 07-November 09
ISBN: 0-7695-1396-4
ASCII Text
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"Empirical Validation of Class Diagram Complexity Metrics," Chilean Computer Science Society, International Conference of the, pp. 0095, XXI International Conference of the Chilean Computer Science Society (SCCC'01), 2001.
 
 
BibTex
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@article{ 10.1109/SCCC.2001.10008,
author = {},
title = {Empirical Validation of Class Diagram Complexity Metrics},
journal ={Chilean Computer Science Society, International Conference of the},
volume = {0},
year = {2001},
isbn = {0-7695-1396-4},
pages = {0095},
doi = {http://doi.ieeecomputersociety.org/10.1109/SCCC.2001.10008},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Chilean Computer Science Society, International Conference of the
TI - Empirical Validation of Class Diagram Complexity Metrics
SN - 0-7695-1396-4
SP
EP
PY - 2001
VL - 0
JA - Chilean Computer Science Society, International Conference of the
ER -
 
Citation:
"Empirical Validation of Class Diagram Complexity Metrics," sccc, pp.0095, XXI International Conference of the Chilean Computer Science Society (SCCC'01), 2001
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