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Source Code Analysis and Manipulation, Fourth IEEE International Workshop on (SCAM'04)
Predicting Class Testability using Object-Oriented Metrics
Chicago, Illinois
September 15-September 16
ISBN: 0-7695-2144-4
ASCII Text
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Magiel Bruntink, Arie van Deursen, "Predicting Class Testability using Object-Oriented Metrics," Source Code Analysis and Manipulation, IEEE International Workshop on, pp. 136-145, Source Code Analysis and Manipulation, Fourth IEEE International Workshop on (SCAM'04), 2004.
 
 
BibTex
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@article{ 10.1109/SCAM.2004.16,
author = {Magiel Bruntink and Arie van Deursen},
title = {Predicting Class Testability using Object-Oriented Metrics},
journal ={Source Code Analysis and Manipulation, IEEE International Workshop on},
volume = {0},
year = {2004},
isbn = {0-7695-2144-4},
pages = {136-145},
doi = {http://doi.ieeecomputersociety.org/10.1109/SCAM.2004.16},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Source Code Analysis and Manipulation, IEEE International Workshop on
TI - Predicting Class Testability using Object-Oriented Metrics
SN - 0-7695-2144-4
SP136
EP145
A1 - Magiel Bruntink,
A1 - Arie van Deursen,
PY - 2004
KW - null
VL - 0
JA - Source Code Analysis and Manipulation, IEEE International Workshop on
ER -
 
Magiel Bruntink, CWI, The Netherlands
Arie van Deursen, CWI and Delft University of Technology, The Netherlands
In this paper we investigate factors of the testability of object-oriented software systems. The starting point is given by a study of the literature to obtain both an initial model of testability and existing OO metrics related to testability. Subsequently, these metrics are evaluated by means of two case studies of large Java systems for which JUnit test cases exist. The goal of this paper is to define and evaluate a set of metrics that can be used to assess the testability of the classes of a Java system.
Citation:
Magiel Bruntink, Arie van Deursen, "Predicting Class Testability using Object-Oriented Metrics," scam, pp.136-145, Source Code Analysis and Manipulation, Fourth IEEE International Workshop on (SCAM'04), 2004
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