loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Fourth International Workshop on Microprocessor Test and Verification Common Challenges and Solutions
Utilizing Various ADL Facets for Instruction Level CPU Test
Hyatt Town Lake Hotel, Austin, Texas
May 29-May 30
ISBN: 0-7695-2045-6
Elham Safi, University of Tehran, Iran
Zohreh Karimi, University of Tehran, Iran
Maghsoud Abbaspour, University of Tehran, Iran
Zainalabedin Navabi, University of Tehran, Iran
As the use of general and special processors as embedded cores in SoC designs increases, developing high quality test programs for them is becoming more important. Software-based self-test methodologies seem a promising way in this arena. Our test method is based on exercising all operations of processor components using macros that justify test values and propagate the results to the component outputs. We use pre-computed deterministic test sets for internal components of processor to generate an efficient test program. Generation of the macros require instruction set and data transfer path information. This and other required information are available in the processor's Architecture Description Language (ADL) specification, which can be provided by the processor core developer as a supplementary deliverable. We have applied our test program generation to a simple 16-bit processor to demonstrate steps involved in our approach for extraction of a test program from an ADL description.
Citation:
Elham Safi, Zohreh Karimi, Maghsoud Abbaspour, Zainalabedin Navabi, "Utilizing Various ADL Facets for Instruction Level CPU Test," mtv, pp.38, Fourth International Workshop on Microprocessor Test and Verification Common Challenges and Solutions, 2003
Usage of this product signifies your acceptance of the Terms of Use.