ITRS Commodity Memory Roadmap

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2003 International Workshop on Memory Technology, Design and Testing (MTDT'03)

San Jose, California

July 28-July 29

ISBN: 0-7695-2004-9

	ASCII Text	x
	Roger Barth, "ITRS Commodity Memory Roadmap," Memory Technology, Design and Testin, IEEE International Workshop on, pp. 61, 2003 International Workshop on Memory Technology, Design and Testing (MTDT'03), 2003.

	BibTex	x
	@article{ 10.1109/MTDT.2003.1222362, author = {Roger Barth}, title = {ITRS Commodity Memory Roadmap}, journal ={Memory Technology, Design and Testin, IEEE International Workshop on}, volume = {0}, year = {2003}, issn = {1087-4852}, pages = {61}, doi = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2003.1222362}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Memory Technology, Design and Testin, IEEE International Workshop on TI - ITRS Commodity Memory Roadmap SN - 1087-4852 SP EP A1 - Roger Barth, PY - 2003 KW - null VL - 0 JA - Memory Technology, Design and Testin, IEEE International Workshop on ER -

Roger Barth, Intel Corporation

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MTDT.2003.1222362

The ITRS (International Technology Roadmap for Semiconductors) roadmap is updated on a yearly basis to forecast industry silicon trends. The ITRS Test Working Group (TWG) identifies the key trends that will have an impact on device test and summarizes them to provide direction to test suppliers. The commodity memory roadmap is a key part of that forecast and covers discrete and embedded DRAM and Flash. The material in this paper represents a very early look at the potential commodity memory roadmap due for release in November of 2003 and is based upon the 2002 roadmap.

Citation:

Roger Barth, "ITRS Commodity Memory Roadmap," mtdt, pp.61, 2003 International Workshop on Memory Technology, Design and Testing (MTDT'03), 2003

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