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2003 International Workshop on Memory Technology, Design and Testing (MTDT'03)
A Fault Primitive Based Analysis of Linked Faults in RAMs
San Jose, California
July 28-July 29
ISBN: 0-7695-2004-9
ASCII Text
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Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor, "A Fault Primitive Based Analysis of Linked Faults in RAMs," Memory Technology, Design and Testin, IEEE International Workshop on, pp. 33, 2003 International Workshop on Memory Technology, Design and Testing (MTDT'03), 2003.
 
 
BibTex
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@article{ 10.1109/MTDT.2003.1222358,
author = {Zaid Al-Ars and Said Hamdioui and Ad J. van de Goor},
title = {A Fault Primitive Based Analysis of Linked Faults in RAMs},
journal ={Memory Technology, Design and Testin, IEEE International Workshop on},
volume = {0},
year = {2003},
issn = {1087-4852},
pages = {33},
doi = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2003.1222358},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Memory Technology, Design and Testin, IEEE International Workshop on
TI - A Fault Primitive Based Analysis of Linked Faults in RAMs
SN - 1087-4852
SP
EP
A1 - Zaid Al-Ars,
A1 - Said Hamdioui,
A1 - Ad J. van de Goor,
PY - 2003
KW - Memory testing
KW - fault primitives
KW - functional fault models
KW - linked faults
KW - march tests
VL - 0
JA - Memory Technology, Design and Testin, IEEE International Workshop on
ER -
 
Zaid Al-Ars, Delft University of Technology
Said Hamdioui, Delft University of Technology
Ad J. van de Goor, Delft University of Technology
Linked faults are very important for memory testing because they reduce the fault coverage of the tests. Their analysis has proven to be a source for new memory tests, characterized by an increased fault coverage for a given test time. This paper presents an analysis of linked faults, based on the concept of fault primitives, such that the whole space of linked faults is investigated, accounted for and validated. The paper also introduces a systematic way to develop tests for such faults.
Index Terms:
Memory testing, fault primitives, functional fault models, linked faults, march tests
Citation:
Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor, "A Fault Primitive Based Analysis of Linked Faults in RAMs," mtdt, pp.33, 2003 International Workshop on Memory Technology, Design and Testing (MTDT'03), 2003
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