Equivalence Checking a 256MB SDRAM

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International Workshop on Memory Technology, Design, and Testing (MTDT'01)

San Jose, California

August 06-August 07

ISBN: 0-7695-1242-9

	ASCII Text	x
	Simon Napper, Dian Yang, "Equivalence Checking a 256MB SDRAM," Memory Technology, Design and Testin, IEEE International Workshop on, pp. 0085, International Workshop on Memory Technology, Design, and Testing (MTDT'01), 2001.

	BibTex	x
	@article{ 10.1109/MTDT.2001.945234, author = {Simon Napper and Dian Yang}, title = {Equivalence Checking a 256MB SDRAM}, journal ={Memory Technology, Design and Testin, IEEE International Workshop on}, volume = {0}, year = {2001}, isbn = {0-7695-1242-9}, pages = {0085}, doi = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2001.945234}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Memory Technology, Design and Testin, IEEE International Workshop on TI - Equivalence Checking a 256MB SDRAM SN - 0-7695-1242-9 SP EP A1 - Simon Napper, A1 - Dian Yang, PY - 2001 VL - 0 JA - Memory Technology, Design and Testin, IEEE International Workshop on ER -

Simon Napper, InnoLogic Systems Inc.

Dian Yang, InnoLogic Systems Inc.

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MTDT.2001.945234

Abstract: This paper outlines how symbolic simulation was used to verify both data and sequence integrity in a 256MB SDRAM. The initial step is to examine the underlying equivalence-checking engine and then explain how it is applied to SDRAM verification. SDRAM verification is interesting in that it captures both memory and sequence verification. The data integrity verification is valid for any type of memory structure and the sequence integrity can be extended to many types of sequenced machines.

Citation:

Simon Napper, Dian Yang, "Equivalence Checking a 256MB SDRAM," mtdt, pp.0085, International Workshop on Memory Technology, Design, and Testing (MTDT'01), 2001

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