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International Workshop on Memory Technology, Design, and Testing (MTDT'01)
An Approach for Evaluation of Redunancy Analysis Algorithms
San Jose, California
August 06-August 07
ISBN: 0-7695-1242-9
ASCII Text
x 
 
S. Shoukourian, V. Vardanian, Y. Zorian, "An Approach for Evaluation of Redunancy Analysis Algorithms," Memory Technology, Design and Testin, IEEE International Workshop on, pp. 0051, International Workshop on Memory Technology, Design, and Testing (MTDT'01), 2001.
 
 
BibTex
x
 
@article{ 10.1109/MTDT.2001.945228,
author = {S. Shoukourian and V. Vardanian and Y. Zorian},
title = {An Approach for Evaluation of Redunancy Analysis Algorithms},
journal ={Memory Technology, Design and Testin, IEEE International Workshop on},
volume = {0},
year = {2001},
isbn = {0-7695-1242-9},
pages = {0051},
doi = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2001.945228},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Memory Technology, Design and Testin, IEEE International Workshop on
TI - An Approach for Evaluation of Redunancy Analysis Algorithms
SN - 0-7695-1242-9
SP
EP
A1 - S. Shoukourian,
A1 - V. Vardanian,
A1 - Y. Zorian,
PY - 2001
VL - 0
JA - Memory Technology, Design and Testin, IEEE International Workshop on
ER -
 
S. Shoukourian, Virage Logic Int.
V. Vardanian, Virage Logic Int.
Y. Zorian, Virage Logic Corp.
Abstract: An approach for design and evaluation of redundancy analysis algorithms based on vectors of preferences is proposed for memory devices with spare elements. Experiments on the application of the new algorithms for Self-Test and Repair (STAR) type SRAM memories have shown the efficiency of the proposed approach.
Citation:
S. Shoukourian, V. Vardanian, Y. Zorian, "An Approach for Evaluation of Redunancy Analysis Algorithms," mtdt, pp.0051, International Workshop on Memory Technology, Design, and Testing (MTDT'01), 2001
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