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2003 International Conference on Microelectronics Systems Education (MSE'03)
Anaheim, California
June 01-June 02
ISBN: 0-7695-1973-3
Minsu Choi, University of Missouri-Rolla
Hardy J. Pottinger, University of Missouri-Rolla
Nohpill Park, Oklahoma State University
Yong-Bin Kim, Northeastern University
As deep-sub-micron and beyond technology emerges, quality assurance of microel ectronic circuits and systems becomes more important than ever. Consequentially, (1) a strong need for well-educated microelectronic circuits and systems test engineers is desired by the industry, (2) graduate-level research efforts are also called to overcome numerous micro- electronic circuits and systems test issues. This paper is to address issues related to increasing impact of the electronic circuits and systems test field on education in electrical and computer engineering and to propose suitable educational topics for undergraduate and graduate-level electrical and computer engineering courses.
Citation:
Minsu Choi, Hardy J. Pottinger, Nohpill Park, Yong-Bin Kim, "NEED FOR UNDERGRADUATE AND GRADUATE-LEVEL EDUCATION IN TESTING OF MICROELECTRONIC CIRCUITS AND SYSTEMS," mse, pp.121, 2003 International Conference on Microelectronics Systems Education (MSE'03), 2003
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