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2003 International Conference on Microelectronics Systems Education (MSE'03)
Anaheim, California
June 01-June 02
ISBN: 0-7695-1973-3
Vin?cius P. Correia, Instituto de Inform?tica - UFRGS
Marcelo Lubaszewski, Instituto de Inform?tica - UFRGS
Andr? I. Reis, Instituto de Inform?tica - UFRGS
This paper presents a didactic simulator for stuck-at (sa) faults on logic circuits. The tool has a set of features that helps to understand the concepts of single and multiple stuck-at faults, being these faults testable or not, and how to generate test vectors in order to test the detectable fault subset. An interface was developed to allow the edition of a circuit, the injection of faults and the fault simulation. The tool performs two simulations concurrently, one for the original circuit and another for the faulty circuit considering the injected faults. When the two simulations differ, for a given input vector, the tool shows the error (detection of the fault) graphically.
Citation:
Vin?cius P. Correia, Marcelo Lubaszewski, Andr? I. Reis, "SIFU! - A Didactic Stuck-at Fault Simulator," mse, pp.93, 2003 International Conference on Microelectronics Systems Education (MSE'03), 2003
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