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2003 International Conference on Microelectronics Systems Education (MSE'03)
Anaheim, California
June 01-June 02
ISBN: 0-7695-1973-3
ASCII Text
x 
 
Y. Bertrand, M-L. Flottes, L. Balado, J. Figueras, A. Biasizzo, F. Novak, S. Di Carlo, P. Prinetto, N. Pricopi, H-J. Wunderlich, J-P. Van der Heyden, "Test Engineering Education in Europe: the EuNICE-Test Project," Microelectronics Systems Education, IEEE International Conference on/Multimedia Software Engineering, International Symposium on, pp. 85, 2003 International Conference on Microelectronics Systems Education (MSE'03), 2003.
 
 
BibTex
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@article{ 10.1109/MSE.2003.1205266,
author = {Y. Bertrand and M-L. Flottes and L. Balado and J. Figueras and A. Biasizzo and F. Novak and S. Di Carlo and P. Prinetto and N. Pricopi and H-J. Wunderlich and J-P. Van der Heyden},
title = {Test Engineering Education in Europe: the EuNICE-Test Project},
journal ={Microelectronics Systems Education, IEEE International Conference on/Multimedia Software Engineering, International Symposium on},
volume = {0},
year = {2003},
isbn = {0-7695-1973-3},
pages = {85},
doi = {http://doi.ieeecomputersociety.org/10.1109/MSE.2003.1205266},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Microelectronics Systems Education, IEEE International Conference on/Multimedia Software Engineering, International Symposium on
TI - Test Engineering Education in Europe: the EuNICE-Test Project
SN - 0-7695-1973-3
SP
EP
A1 - Y. Bertrand,
A1 - M-L. Flottes,
A1 - L. Balado,
A1 - J. Figueras,
A1 - A. Biasizzo,
A1 - F. Novak,
A1 - S. Di Carlo,
A1 - P. Prinetto,
A1 - N. Pricopi,
A1 - H-J. Wunderlich,
A1 - J-P. Van der Heyden,
PY - 2003
KW - null
VL - 0
JA - Microelectronics Systems Education, IEEE International Conference on/Multimedia Software Engineering, International Symposium on
ER -
 
Y. Bertrand, University of Montpellier, France
M-L. Flottes, University of Montpellier, France
L. Balado, Universitat Polit?cnica de Catalunya
J. Figueras, Universitat Polit?cnica de Catalunya
A. Biasizzo, Jozef Stefan Institute
F. Novak, Jozef Stefan Institute
S. Di Carlo, Politecnico di Torino
P. Prinetto, Politecnico di Torino
N. Pricopi, Universit?t Stuttgart
H-J. Wunderlich, Universit?t Stuttgart
J-P. Van der Heyden, Agilent Technologies France
The paper deals with a European experience of education in industrial test of ICs and SoCs using remote testing facilities. The project addresses the problem of the shortage in microelectronics engineers aware with the new challenge of testing mixed-signal SoCs for multimedia/telecom market. It aims at providing test training facilities at a European scale in both initial and continuing education contexts. This is done by allowing the academic and industrial partners of the consortium to train engineers using the common test resources center (CRTC) hosted by LIRMM (Laboratoire d'Informatique, de Robotique et de Micro?lectronique de Montpellier, France). CRTC test tools include up-to-date/high-tech testers that are fully representative of real industrial testers as used on production testfloors. At the end of the project, it is aimed at reaching a cruising speed of about 16 trainees per year per center. Each trainee will have attend at least one one-week training using the remote test facilities of CRTC.
Citation:
Y. Bertrand, M-L. Flottes, L. Balado, J. Figueras, A. Biasizzo, F. Novak, S. Di Carlo, P. Prinetto, N. Pricopi, H-J. Wunderlich, J-P. Van der Heyden, "Test Engineering Education in Europe: the EuNICE-Test Project," mse, pp.85, 2003 International Conference on Microelectronics Systems Education (MSE'03), 2003
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