This paper describes the production deployment of a fast transient testing (FASTest) methodology for analog circuits. Unlike traditional sequential specification testing applied to analog circuits today, the FASTest transient test methodology applies optimized and concise transient stimuli to multiple pins of an IC simultaneously. The resulting response is captured, and transformed using algorithms into standard IC test parameters. The test process is transparent to the test engineer who only sees the same test results that would have been obtained with (current) standard specification testing of analog ICs. Implementation of the transient test methodology and results from a large volume qualification procedure for a precision operational amplifier are described. In production test, the FASTest test methodology is seen to provide more than 3X reduction in test time, while providing the same test quality.