Analog Circuit Test using Transfer Function Coe .cient Estimates

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International Test Conference 2003 (ITC'03)

Charlotte, NC, USA

September 30-October 02

ISBN: 0-7803-8107-6

	ASCII Text	x
	Zhen Guo, Jacob Savir, "Analog Circuit Test using Transfer Function Coe .cient Estimates," Test Conference, International, pp. 1155, International Test Conference 2003 (ITC'03), 2003.

	BibTex	x
	@article{ 10.1109/TEST.2003.1271104, author = {Zhen Guo and Jacob Savir}, title = {Analog Circuit Test using Transfer Function Coe .cient Estimates}, journal ={Test Conference, International}, volume = {0}, year = {2003}, issn = {1089-3539}, pages = {1155}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271104}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Analog Circuit Test using Transfer Function Coe .cient Estimates SN - 1089-3539 SP EP A1 - Zhen Guo, A1 - Jacob Savir, PY - 2003 KW - Fault detection KW - Parametric faults KW - Monte-Carlo simulation KW - System identification VL - 0 JA - Test Conference, International ER -

Zhen Guo, New Jersey Institute of Technology

Jacob Savir, New Jersey Institute of Technology

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271104

Coefficient-based test (CBT) is introduced for detecting parametric faults in analog circuits. The method uses pseudo Monte-Carlo simulation and system identification tools to determine whether a given circuit under test (CUT) is faulty.

Index Terms:

Fault detection, Parametric faults, Monte-Carlo simulation, System identification

Citation:

Zhen Guo, Jacob Savir, "Analog Circuit Test using Transfer Function Coe .cient Estimates," itc, pp.1155, International Test Conference 2003 (ITC'03), 2003

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