A Case Study of IR-Drop in Structured At-Speed Testing

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	Similar Articles Articles by Jayashree Saxena Articles by Kenneth M. Butler Articles by Vinay B. Jayaram Articles by Subhendu Kundu Articles by N. V. Arvind Articles by Pravin Sreeprakash Articles by Manfred Hachinger

International Test Conference 2003 (ITC'03)

Charlotte, NC, USA

September 30-October 02

ISBN: 0-7803-8107-6

	ASCII Text	x
	Jayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger, "A Case Study of IR-Drop in Structured At-Speed Testing," Test Conference, International, pp. 1098, International Test Conference 2003 (ITC'03), 2003.

	BibTex	x
	@article{ 10.1109/TEST.2003.1271098, author = {Jayashree Saxena and Kenneth M. Butler and Vinay B. Jayaram and Subhendu Kundu and N. V. Arvind and Pravin Sreeprakash and Manfred Hachinger}, title = {A Case Study of IR-Drop in Structured At-Speed Testing}, journal ={Test Conference, International}, volume = {0}, year = {2003}, issn = {1089-3539}, pages = {1098}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271098}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - A Case Study of IR-Drop in Structured At-Speed Testing SN - 1089-3539 SP EP A1 - Jayashree Saxena, A1 - Kenneth M. Butler, A1 - Vinay B. Jayaram, A1 - Subhendu Kundu, A1 - N. V. Arvind, A1 - Pravin Sreeprakash, A1 - Manfred Hachinger, PY - 2003 KW - null VL - 0 JA - Test Conference, International ER -

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271098

At-speed test has become a requirement in IC technologies below 180 nm. Unfortunately, test mode switching activity and IR-drop present special challenges to the successful application of structural at-speed tests. In this paper we characterize these problems on commercial ASICs in order to understand how to implement more effective solutions.

Citation:

Jayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger, "A Case Study of IR-Drop in Structured At-Speed Testing," itc, pp.1098, International Test Conference 2003 (ITC'03), 2003

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