On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs

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International Test Conference 2003 (ITC'03)

Charlotte, NC, USA

September 30-October 02

ISBN: 0-7803-8107-6

	ASCII Text	x
	Huaxing Tang, Sudhakar M. Reddy, Irith Pomeranz, "On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs," Test Conference, International, pp. 1079, International Test Conference 2003 (ITC'03), 2003.

	BibTex	x
	@article{ 10.1109/TEST.2003.1271096, author = {Huaxing Tang and Sudhakar M. Reddy and Irith Pomeranz}, title = {On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs}, journal ={Test Conference, International}, volume = {0}, year = {2003}, issn = {1089-3539}, pages = {1079}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271096}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs SN - 1089-3539 SP EP A1 - Huaxing Tang, A1 - Sudhakar M. Reddy, A1 - Irith Pomeranz, PY - 2003 KW - null VL - 0 JA - Test Conference, International ER -

Huaxing Tang, University of Iowa, IA

Sudhakar M. Reddy, University of Iowa, IA

Irith Pomeranz, Purdue University, West Lafayette, IN

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271096

We propose a new method for reducing test data volume and test application time in scan designs with multiple scan chains. The method uses a reconfigurable switch to apply tests from a limited number of external inputs to a large number of internal scan chains. The reconfigurable switch allows different subsets of scan chains to be connected to the same external input at different times, thus allowing varied tests to be applied to the circuit.

Citation:

Huaxing Tang, Sudhakar M. Reddy, Irith Pomeranz, "On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs," itc, pp.1079, International Test Conference 2003 (ITC'03), 2003

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