Overview of the IEEE P1500 Standard

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Francisco DaSilva Articles by Yervant Zorian Articles by Lee Whetsel Articles by Karim Arabi Articles by Rohit Kapur

International Test Conference 2003 (ITC'03)

Charlotte, NC, USA

September 30-October 02

ISBN: 0-7803-8107-6

	ASCII Text	x
	Francisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur, "Overview of the IEEE P1500 Standard," Test Conference, International, pp. 988, International Test Conference 2003 (ITC'03), 2003.

	BibTex	x
	@article{ 10.1109/TEST.2003.1271086, author = {Francisco DaSilva and Yervant Zorian and Lee Whetsel and Karim Arabi and Rohit Kapur}, title = {Overview of the IEEE P1500 Standard}, journal ={Test Conference, International}, volume = {0}, year = {2003}, issn = {1089-3539}, pages = {988}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271086}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Overview of the IEEE P1500 Standard SN - 1089-3539 SP EP A1 - Francisco DaSilva, A1 - Yervant Zorian, A1 - Lee Whetsel, A1 - Karim Arabi, A1 - Rohit Kapur, PY - 2003 KW - null VL - 0 JA - Test Conference, International ER -

Francisco DaSilva, Synopsys, Inc., Mountain View, CA

Yervant Zorian, Virage Logic, Fremont, CA

Lee Whetsel, Texas Instruments, Dallas, TX

Karim Arabi, PMC Sierra, Burnaby, BC

Rohit Kapur, Synopsys, Inc., Mountain View, CA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271086

Design reuse has been a key enabler to efficient System-On-Chip creation, by allowing pre-designed functions to be leveraged, thereby reducing development cycles and time to market. The test of these pre-designed blocks, often referred to as cores, is a primordial factor to successful design reuse methodologies, and must be considered by anticipation with various degrees of challenges depending on the mergeable or non-mergeable nature of the core. This paper presents the state and accomplishments of the IEEE 1500 proposal for the test of non-mergeable cores.

Citation:

Francisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur, "Overview of the IEEE P1500 Standard," itc, pp.988, International Test Conference 2003 (ITC'03), 2003

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.