loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
International Test Conference 2003 (ITC'03)
Test-Based Model Generation For Legacy Systems
Charlotte, NC, USA
September 30-October 02
ISBN: 0-7803-8107-6
Hardi Hungar, University of Dortmund, Germany; METAFrame Technologies GmbH, Germany
Tiziana Margaria, University of Dortmund, Germany; METAFrame Technologies GmbH, Germany
Bernhard Steffen, University of Dortmund, Germany
We study the extension of applicability of system-level testing techniques to the construction of a consistent model of (legacy) systems under test, which are seen as black boxes. We gather observations via an automated test environment and systematically extend available test suites according to learning procedures. Testing plays two roles here: (i) as an application domain and (ii) as the enabling technology for the adopted learning technique. The benefits include enhanced error detection and diagnosis, both during the testing phase and the online test of deployed systems at customer sites.
Citation:
Hardi Hungar, Tiziana Margaria, Bernhard Steffen, "Test-Based Model Generation For Legacy Systems," itc, pp.971, International Test Conference 2003 (ITC'03), 2003
Usage of this product signifies your acceptance of the Terms of Use.