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International Test Conference 2003 (ITC'03)
Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic Systems Assembly Using Real-Coded Genetic Algorithms
Charlotte, NC, USA
September 30-October 02
ISBN: 0-7803-8107-6
ASCII Text
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Zhen Shi, Peter Sandborn, "Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic Systems Assembly Using Real-Coded Genetic Algorithms," Test Conference, International, pp. 937, International Test Conference 2003 (ITC'03), 2003.
 
 
BibTex
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@article{ 10.1109/TEST.2003.1271080,
author = {Zhen Shi and Peter Sandborn},
title = {Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic Systems Assembly Using Real-Coded Genetic Algorithms},
journal ={Test Conference, International},
volume = {0},
year = {2003},
issn = {1089-3539},
pages = {937},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271080},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Test Conference, International
TI - Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic Systems Assembly Using Real-Coded Genetic Algorithms
SN - 1089-3539
SP
EP
A1 - Zhen Shi,
A1 - Peter Sandborn,
PY - 2003
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Zhen Shi, University of Maryland
Peter Sandborn, University of Maryland
This paper presents a framework for optimizing the location(s) and characteristics (fault coverage/test cost, rework success rate/rework cost) of Test/Diagnosis/Rework (TDR) operations in the assembly process for electronic systems. A new search algorithm called Waiting Sequence Search (WSS) is applied to traverse a general process flow in order to perform the cumulative calculation of a yielded cost objective function. Real-Coded Genetic Algorithms (RCGAs) are used to perform a multi-variable optimization that minimizes yielded cost. Several simple cases are analyzed for validation and a general complex process flow is used to demonstrate the applicability of the algorithm.
Citation:
Zhen Shi, Peter Sandborn, "Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic Systems Assembly Using Real-Coded Genetic Algorithms," itc, pp.937, International Test Conference 2003 (ITC'03), 2003
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