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International Test Conference 2003 (ITC'03)
On-line Detection of Faults in Carry-Select Adders
Charlotte, NC, USA
September 30-October 02
ISBN: 0-7803-8107-6
ASCII Text
x 
 
B. Kiran Kumar, P. K. Lala, "On-line Detection of Faults in Carry-Select Adders," Test Conference, International, pp. 912, International Test Conference 2003 (ITC'03), 2003.
 
 
BibTex
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@article{ 10.1109/TEST.2003.1271077,
author = {B. Kiran Kumar and P. K. Lala},
title = {On-line Detection of Faults in Carry-Select Adders},
journal ={Test Conference, International},
volume = {0},
year = {2003},
issn = {1089-3539},
pages = {912},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271077},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - On-line Detection of Faults in Carry-Select Adders
SN - 1089-3539
SP
EP
A1 - B. Kiran Kumar,
A1 - P. K. Lala,
PY - 2003
KW - null
VL - 0
JA - Test Conference, International
ER -
 
B. Kiran Kumar, University of Arkansas, Fayetteville
P. K. Lala, University of Arkansas, Fayetteville
This paper proposes an architecture for implementing a self-checking 4-bit carry select adder that can be extended to any n-bit addition. The overhead is directly proportional to the number of transistors in the adder.
Citation:
B. Kiran Kumar, P. K. Lala, "On-line Detection of Faults in Carry-Select Adders," itc, pp.912, International Test Conference 2003 (ITC'03), 2003
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