Case Study - Using STIL as Test Pattern Language

I
ITC
2003
International Test Conference 2003 (ITC'03)
Abstract - Case Study - Using STIL as Test Pattern Language

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International Test Conference 2003 (ITC'03)

Charlotte, NC, USA

September 30-October 02

ISBN: 0-7803-8107-6

	ASCII Text	x
	Daniel Fan, Steve Roehling, Rusty Carruth, "Case Study - Using STIL as Test Pattern Language," Test Conference, International, pp. 811, International Test Conference 2003 (ITC'03), 2003.

	BibTex	x
	@article{ 10.1109/TEST.2003.1270913, author = {Daniel Fan and Steve Roehling and Rusty Carruth}, title = {Case Study - Using STIL as Test Pattern Language}, journal ={Test Conference, International}, volume = {0}, year = {2003}, issn = {1089-3539}, pages = {811}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270913}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Case Study - Using STIL as Test Pattern Language SN - 1089-3539 SP EP A1 - Daniel Fan, A1 - Steve Roehling, A1 - Rusty Carruth, PY - 2003 KW - null VL - 0 JA - Test Conference, International ER -

Daniel Fan, NPTest, Inc. LLC

Steve Roehling, NPTest, Inc. LLC

Rusty Carruth, NPTest, Inc. LLC

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270913

This paper describes the implementation of a test pattern language using STIL [1], the IEEE Standard Test Interface Language (1450-1999), in a next generation, open architecture Automated Test Equipment (ATE) platform. The advantages of this approach in extensibility and easy interface with Electronic Design Automation (EDA) tools for the ATE user are presented. Some challenges of using STIL as a general purpose ATE test pattern language are also presented. The overall EDA and ATE strategy and pattern system architecture based upon STIL are discussed.

Citation:

Daniel Fan, Steve Roehling, Rusty Carruth, "Case Study - Using STIL as Test Pattern Language," itc, pp.811, International Test Conference 2003 (ITC'03), 2003

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