The Testability Features of The ARM1026EJ Microprocessor Core

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International Test Conference 2003 (ITC'03)

Charlotte, NC, USA

September 30-October 02

ISBN: 0-7803-8107-6

	ASCII Text	x
	Teresa L. McLaurin, Frank Frederick, Rich Slobodnik, "The Testability Features of The ARM1026EJ Microprocessor Core," Test Conference, International, pp. 773, International Test Conference 2003 (ITC'03), 2003.

	BibTex	x
	@article{ 10.1109/TEST.2003.1270907, author = {Teresa L. McLaurin and Frank Frederick and Rich Slobodnik}, title = {The Testability Features of The ARM1026EJ Microprocessor Core}, journal ={Test Conference, International}, volume = {0}, year = {2003}, issn = {1089-3539}, pages = {773}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270907}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - The Testability Features of The ARM1026EJ Microprocessor Core SN - 1089-3539 SP EP A1 - Teresa L. McLaurin, A1 - Frank Frederick, A1 - Rich Slobodnik, PY - 2003 KW - null VL - 0 JA - Test Conference, International ER -

Teresa L. McLaurin, ARM Inc.

Frank Frederick, ARM Inc.

Rich Slobodnik, ARM Inc.

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270907

The DFT and Test challenges faced, and the solutions applied, to the ARM1026EJ microprocessor core are described in this paper. New DFT techniques have been created to address the challenges of distributing a DFT core solution that will ultimately end up in many different environments. This core was instantiated into a test chip. The new DFT features were utilized successfully in the SoC.

Citation:

Teresa L. McLaurin, Frank Frederick, Rich Slobodnik, "The Testability Features of The ARM1026EJ Microprocessor Core," itc, pp.773, International Test Conference 2003 (ITC'03), 2003

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