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International Test Conference 2003 (ITC'03)
Testability Features of the Alpha 21364 Microprocessor
Charlotte, NC, USA
September 30-October 02
ISBN: 0-7803-8107-6
ASCII Text
x 
 
Scott Erlanger, Dilip K. Bhavsar, Richard Davies, "Testability Features of the Alpha 21364 Microprocessor," Test Conference, International, pp. 764, International Test Conference 2003 (ITC'03), 2003.
 
 
BibTex
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@article{ 10.1109/TEST.2003.1270906,
author = {Scott Erlanger and Dilip K. Bhavsar and Richard Davies},
title = {Testability Features of the Alpha 21364 Microprocessor},
journal ={Test Conference, International},
volume = {0},
year = {2003},
issn = {1089-3539},
pages = {764},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270906},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - Testability Features of the Alpha 21364 Microprocessor
SN - 1089-3539
SP
EP
A1 - Scott Erlanger,
A1 - Dilip K. Bhavsar,
A1 - Richard Davies,
PY - 2003
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Richard Davies, Hewlett-Packard Company
The custom testability strategy of the Alpha 21364, Hewlett-Packard's most recent Alpha microprocessor, builds upon its Alpha 21264 embedded core. Several additional DFT features integrate to meet the testing challenges of the new generation.
Citation:
Scott Erlanger, Dilip K. Bhavsar, Richard Davies, "Testability Features of the Alpha 21364 Microprocessor," itc, pp.764, International Test Conference 2003 (ITC'03), 2003
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